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[06/20]Investigation of Equivalent Accelerated Life Testing Plans

讲座题目Investigation of Equivalent Accelerated Life Testing Plans

报告人Elsayed A. Elsayed

时 间620日(周一)上午1030-1200
地 点:北京大学英杰交流中心第六会议室


Traditional ALTs are conducted at constant stresses and require extensive test time. In this presentation, we investigate the development of equivalent ALT plans such that the reliability predictions at normal conditions using the results of these plans will be equivalent but the test duration is significantly shorted. We determine the optimum parameters of the test plans and demonstrate its applicability through a numerical example and evaluate the equivalence of the test plans using simulation.


E. A. Elsayed is Professor II (Distinguished Professor) of the Department of Industrial and Systems Engineering, Rutgers University. He is also the Director of the NSF/ Industry/ University Co-operative Research Center for Quality and Reliability Engineering. He was the Chair of ISE, Rutgers University from 1983 to 2001. His research interests are in the areas of quality and reliability engineering and Production Planning and Control. He is a co-author of Quality Engineering in Production Systems, McGraw Hill Book Company, 1989. He is also the author of Reliability Engineering, Addison-Wesley, 1996. These two books received the 1990 and 1997 IIE Joint Publishers Book-of-the-Year Award respectively. He has received many awards and honors and was the keynote speaker of many international conferences.
    Dr. Elsayed is also a co-author of Analysis and control of Production Systems, Prentice-Hall, 2nd Edition, 1994. His research has been funded by the DoD, FAA, NSF and industry. Dr. Elsayed has been a consultant for AT&T Bell Laboratories, Ingersoll-Rand, Johnson & Johnson, Personal Products, AT&T Communications, BellCore and other companies. He served as the Editor-in-Chief of the IIE Transactions and the Editor of the IIE Transactions on Quality and Reliability Engineering. Dr. Elsayed is also the Editor of the International Journal of Reliability, Quality and Safety Engineering. He serves on the editorial boards of eight journals in different capacities.
    Dr. Elsayed has been involved in accelerated life testing since 1987 when he developed a reliability prediction model for the first transatlantic fiber optics cable during his sabbatical at Bell Laboratories. Since then he developed a general accelerated statistics-physics based model to predict reliability at normal operating conditions. During the last twelve years he has been extending his work to the degradation modeling area and design of accelerated life testing plans. He has verified his models by conducting extensive accelerated life testing on variety of products using the quality and reliability engineering laboratory at Rutgers.