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[05/24]Integrated Nanomanufacturing and Nanoinformatics for Quality Improvement

讲座题目Integrated Nanomanufacturing and Nanoinformatics for Quality Improvement

报告人Prof. Qiang Huang

时 间524日(周二)下午3:00-4:30
地 点:方正大厦608会议室
主持人
张玺(特聘研究员)

报告内容摘要

Nanomanufacturing has been a major bottleneck to fulfill the promise of nanotechnology owing to the lack of system-level variation control methodologies to achieve cost-effective manufacturing of nanoscale materials and devices. The fundamental research challenges of developing such methodologies come from two major aspects: (1) multiscale process variations in nanomanufacturing, and (2) the scarcity of measurement data, a lack of observation during processing, and limited physical knowledge. We propose to develop integrated nanomanufacturing and nanoinformatics (INN) methodologies for quality improvement in nanomanufacturing. The core of INN methodologies is multiscale process variation modeling, which provides the base for the subsequent process monitoring, control, and measurement strategies. In this talk, examples of applying INN to nanowire growth and nanocomposite manufacturing process modeling will be presented. The talk is based on two papers published/accepted on IIE Transactions.

报告人简介

Dr. Qiang Huang is currently an Assistant Professor at Daniel J. Epstein Department of Industrial and Systems Engineering of USC. He has served as an Associate Editor (Quality, Micro and Nanomanufacturing Systems) for SME Journal of Manufacturing Systems since 2008. He is one of the guest editors for Special Issue of the IIE Transactions on Quality and Reliability Engineering/Manufacturing and Design: "Quality, Sensing and Prognostics Issues in Nanomanufacturing". He is a member of 2009-2011 Scientific Committee (Editorial Board) for the North American Manufacturing Research Institution (NAMRI) of SME. He has been an Associate Editor (Automation in Meso, Micro and Nano-Scale) for 2009 and 2010 IEEE Conference on Automation Science and Engineering.